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Atomic Force Microscope - Company Ranking(12 companies in total)

Last Updated： Aggregation Period:Apr 01, 2026〜Apr 28, 2026
This ranking is based on the number of page views on our site.

Company Name Featured Products
Product Image, Product Name, Price Range overview Application/Performance example
一般財団法人材料科学技術振興財団　MST 一般財団法人材料科学技術振興財団　MST
[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements
[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

Other

 For detailed data, please refer to the catalog. Analysis of displays, electronic components, manufacturing equipment, parts, daily necessities, and pharmaceuticals.
Atomic Force Microscopy (AFM) method
Atomic Force Microscopy (AFM) method

Other

 ■ Probe Used A sharp probe made by processing silicon single crystal wafers is used to scan the sample surface. The tip diameter has been ... - Surface roughness evaluation of substrates (Si, compound semiconductors, glass, metals, organic materials, etc.) - Surface roughness evalu...
[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes
[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

Other

 For more details, please download the materials or contact us. Analysis of biotechnology, pharmaceuticals, daily necessities, and food.
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  1. 一般財団法人材料科学技術振興財団　MST 一般財団法人材料科学技術振興財団　MST
    Featured Products
    [Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements
    overview
    For detailed data, please refer to the catalog.
    Application/Performance example
    Analysis of displays, electronic components, manufacturing equipment, parts, daily necessities, and pharmaceuticals.
    Atomic Force Microscopy (AFM) methodAtomic Force Microscopy (AFM) method
    overview
    ■ Probe Used A sharp probe made by processing silicon single crystal wafers is used to scan the sample surface. The tip diameter has been ...
    Application/Performance example
    - Surface roughness evaluation of substrates (Si, compound semiconductors, glass, metals, organic materials, etc.) - Surface roughness evalu...
    [Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes
    overview
    For more details, please download the materials or contact us.
    Application/Performance example
    Analysis of biotechnology, pharmaceuticals, daily necessities, and food.
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