We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Atomic Force Microscope.
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Atomic Force Microscope - Company Ranking(12 companies in total)

Last Updated: Aggregation Period:Dec 17, 2025〜Jan 13, 2026
This ranking is based on the number of page views on our site.

Company Name Featured Products
Product Image, Product Name, Price Range overview Application/Performance example
【Surface Inspection】 ◆Atomic Force Scanning Electron Microscope (AFM & SEM in situ measurement) by Quantum Design North America ◇Atomic Forc... ◆Semiconductor wafer surface inspection ◇Semiconductor manufacturing process If you have any questions or inquiries, please feel free t...
【Specifications (Excerpt)】 ■ Usable sample size: within 12mm square / up to 3.5mm in height ■ Sample stage movement range: 12mm in the plane... 【Purpose】 ■ Education in nanotechnology at universities and vocational schools, as well as in research and development or quality control se...
【Features】 ■ Ultra-high resolution 28-bit DAC ■ Maximum scanning range (X, Y, Z): 100μm, 100μm, 20μm ■ Z noise level: 30pm RMS value ■ New s... For more details, please refer to the PDF document or feel free to contact us.
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  1. Featured Products
    [Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist[Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist
    overview
    【Surface Inspection】 ◆Atomic Force Scanning Electron Microscope (AFM & SEM in situ measurement) by Quantum Design North America ◇Atomic Forc...
    Application/Performance example
    ◆Semiconductor wafer surface inspection ◇Semiconductor manufacturing process If you have any questions or inquiries, please feel free t...
    Compact Type Atomic Force Microscope NaioAFMCompact Type Atomic Force Microscope NaioAFM
    overview
    【Specifications (Excerpt)】 ■ Usable sample size: within 12mm square / up to 3.5mm in height ■ Sample stage movement range: 12mm in the plane...
    Application/Performance example
    【Purpose】 ■ Education in nanotechnology at universities and vocational schools, as well as in research and development or quality control se...
    High-performance atomic force microscope DriveAFMHigh-performance atomic force microscope DriveAFM
    overview
    【Features】 ■ Ultra-high resolution 28-bit DAC ■ Maximum scanning range (X, Y, Z): 100μm, 100μm, 20μm ■ Z noise level: 30pm RMS value ■ New s...
    Application/Performance example
    For more details, please refer to the PDF document or feel free to contact us.