We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Atomic Force Microscope.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

Atomic Force Microscope - Company Ranking(12 companies in total)

Last Updated： Aggregation Period:Nov 05, 2025〜Dec 02, 2025
This ranking is based on the number of page views on our site.

Company Name Featured Products
Product Image, Product Name, Price Range overview Application/Performance example
一般財団法人材料科学技術振興財団　MST 一般財団法人材料科学技術振興財団　MST
[Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA
[Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA

Other

 For detailed data, please refer to the catalog. Product field: Food Analysis purpose: Shape evaluation, product investigation, mechanical property evaluation
Atomic Force Microscopy (AFM) method
Atomic Force Microscopy (AFM) method

Other

 ■ Probe Used A sharp probe made by processing silicon single crystal wafers is used to scan the sample surface. The tip diameter has been ... - Surface roughness evaluation of substrates (Si, compound semiconductors, glass, metals, organic materials, etc.) - Surface roughness evalu...
[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes
[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

Other

 For more details, please download the materials or contact us. Analysis of biotechnology, pharmaceuticals, daily necessities, and food.
---
---

---

 ---
  1. 一般財団法人材料科学技術振興財団　MST 一般財団法人材料科学技術振興財団　MST
    Featured Products
    [Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA[Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA
    overview
    For detailed data, please refer to the catalog.
    Application/Performance example
    Product field: Food Analysis purpose: Shape evaluation, product investigation, mechanical property evaluation
    Atomic Force Microscopy (AFM) methodAtomic Force Microscopy (AFM) method
    overview
    ■ Probe Used A sharp probe made by processing silicon single crystal wafers is used to scan the sample surface. The tip diameter has been ...
    Application/Performance example
    - Surface roughness evaluation of substrates (Si, compound semiconductors, glass, metals, organic materials, etc.) - Surface roughness evalu...
    [Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes
    overview
    For more details, please download the materials or contact us.
    Application/Performance example
    Analysis of biotechnology, pharmaceuticals, daily necessities, and food.
  2. ---
COPYRIGHT © 2001-2025 IPROS CORPORATION ALL RIGHTS RESERVED.